■ Fine Pitch Testing

These products are used mainly for inspecting semiconductor wafers, and can deal with a pitch of up to 110 μm. Various plunger materials are available.

■High Frequency Testing

These products are used for inspecting semiconductors with excellent RF characteristics that can tolerate high-speed devices, and their length has been reduced to 1.6 mm. Various plunger materials are available.

■High Temperature Testing

In order to meet the heat resistance requirement for reliability tests, we  developed our Hotpin, which can tolerate 175 degrees Celsius as well as our new Dragon Probe which can handle 200 degrees Celsius.

■ Kelvin Test

These products are used for 4-terminal measurement achieving reliable probe contact, and can provide a minimum diameter of φ0.15mm. They are available in various plunger materials and shapes, and can reliably contact very narrow pads.

■ High Current Testing

A special structure makes it possible to measure high current with low resistance.

We have developed standardized probes for each pitch, in order to realize low prices and short turnaround time. We now offer the following probes for IC Sockets.

• For 0.4mm pitch
• For 0.5mm pitch
• For 0.65mm pitch
• For 0.8mm pitch
• For 1.0mm pitch